- Characterization of mono- & multicrystalline silicon
- Spectroscopic ellipsometer
- Laser ellipsometer
- Variable angle ellipsometer
- Thin film sensors
- Reflectometer
- Spectroscopic ellipsometer
- Off-line / in-line / at-line
- Large area mapping
- Minority carrier lifetime
- Photoconductivity
- Resistivity
Crystalline Silicon Solar Cells
Methods: | laser ellipsometry, spectroscopic ellipsometry | |
Measurement of: | thin film thickness, refractive index | |
Applications: | textured mono- and multicrystalline surfaces, AR antireflective coatings (SiNx, ITO, TiO2), thin passivation layers (SiO2, Al2O3), single films, double layer and multilayer stacks ( |
Thin Film Solar Cells
Methods: | reflectometry, transmission, spectroscopic ellipsometry, 4-point probe measurement | |
Measurement of: | thin film thickness, refractive index, sheet resistance, spectrally resolved haze H(λ), reflection R(λ), transmission T(λ), absorption, crystallinity, |
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Applications: | thin films on large glass sheets, smooth and textured TCO films, thin CdS films, a-Si, µ-Si, CIGS, CdTe absorber films, buffer layers, complex layer stacks |